RE: [ng-spice-devel] Joining


To "'ng-spice-devel@ieee.ing.uniroma1.it'" <ng-spice-devel@ieee.ing.uniroma1.it>
From "Gillespie, Alan" <Alan.Gillespie@analog.com>
Date Wed, 23 Aug 2000 10:37:28 +0100
Delivered-To mailing list ng-spice-devel@ieee.ing.uniroma1.it
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Reply-To ng-spice-devel@ieee.ing.uniroma1.it

Hi Folks,

I'm new to this "mailing list" thing, so I was going to just
"listen" for a while, but I can't figure out how to get the
last 100 messages or so, so that I can see what's going on.

Anyway, I've been hacking Berkeley Spice 3f4/5 for the last
few years, and I think I've got it working quite well now.
This is a (probably incomplete) list of the "fixes" I've
implemented so far :-


Berkeley Spice 3f4 Change List


Output File Format Changes -

  Rawfile format changed to PSPICE Probe format (Usable with
  Demo version of Microsim's Probe).

  Text mode .OP results even though "rawfile" written.

  Internal device nodes are not saved to "rawfile" (reduces
  file size). Optionally, these internal nodes can be replaced
  by device currents and saved.


DC Convergence Enhancements -

  "Source-Stepping" algorithm modified with a "Dynamic" step size.
  After each successful step, the node voltages are saved, the
  source-factor is increased by the step-factor, and the step-factor
  is increased (for the next step). If the step fails, i.e. the
  circuit does not converge, the source-factor is set to the value
  from the previous successful step, the previously stored node
  voltages are restored, the step-factor is reduced, the source
  factor is increased by this smaller step-factor, and convergance
  is attempted again.

  Same thing done for "Gmin-stepping" algorithm.

  "Gshunt" option added. This sets the "diagGmin" variable used in
  the gmin-stepping algorithm to a non-zero value for the final
  solution. (Normally this is set to zero for the final solution).
  This helps for circuits with floating nodes (and for some others
  too).

  The Gmin implementation across the substrate diodes of MOS1, MOS2,
  MOS3, MOS6 and BSIM3 devices, and across BJT base-emitter and
  base-collector diodes, was incorrect. Correcting this dramatically
  improved DC convergance. (I think this also effects BSIM1 and 2
  but I haven't fixed them yet !)

  The gm, gmb and gds calculations in the MOS3 model were all wrong.
  The device equations were fixed, leading to much improved
  convergance.

  The Vcrit value used for diode voltage limiting was calculated
  without taking into account the device area (and in some cases
  without using the temperature corrected saturation current).
  This could cause floating point overflows, especially in device
  models designed to be scaled by a small area, e.g. 2u by 2u diodes
  (area=4e-12). This is now fixed for Diode, BJT, MOS1, MOS2, and
  MOS3 models.

  The diode voltage limiting was modified to add negative voltage
  limiting. Negative diode voltages are now limited to 3*Vdp-10,
  where Vdp is the voltage from the previous iteration. If Vdp is
  positive, then the voltage is limited to -10V. This prevents some
  more floating point overflows. (Actually, I'm still playing with
  the best values for this).

  The Spice3 "fix" for the MOS3 gds discontinuity between the
  linear and saturated regions only works if the VMAX parameter
  is non-zero. A "tweak" has been added for the VMAX=0 case.


Transient Convergance Enhancements -

  The Meyer capacitance model for MOS1,2&3 gate capacitance has a
  "bug" (or feature) that the largest fraction of the gate capacitance
  is attributed to the device source, and the rest to the drain.
  Ordinarily, this is fine, but if the Vds of the device crosses zero,
  i.e. the "logical" source moves from the "physical" source pin to
  the "physical" drain pin, (and the drain moves from the drain pin to
  the source pin), then the capacitance moves instantly between the
  pins. This results in an effective discontinuity in the capacitances
  between the device pins, and can cause very small time-steps or even
  the failure of the simulation. This discontinuity is now prevented by
  "moving" the capacitance smoothly between the pins when
  Vds<Max(Vdsat,25mV).

  Temperature correction of various diode capacitances was implemented
  slightly incorrectly, leading to capacitance discontinuities in
  simulations at temperatures other than nominal. This affected the
  Diode and MOS3 models.

  A mistake in the implementation of the MOS3 source-bulk capacitance
  model resulted in a charge storage discontinuity. This has been fixed.

  The level 2 MOSFET model seems to calculate Von and Vth values for
  the threshold and subthreshold values respectively, but then uses
  Vbin to calculate the Vdsat voltage used to find the drain current.
  However, a jump statement uses Von to decide that the device is in
  the "cutoff" region, which means that when this jump allows the
  drain current to be calculated, Vdsat can already be well above
  zero. This leads to a discontinuity of drain current with respect
  to gate voltage. The code is now modified to use Vbin for the jump
  decision. It looks like the code should actually use Vth as the
  threshold voltage, but since PSPICE and HSPICE both follow the
  original Berkeley code, this was left alone.


New Model Parameters -

  A PSPICE/HSPICE-like "M" device parameter (i.e. M devices in
  parallel) was added to the MOS1,2,3 and BSIM3 mosfet models.

  A level 9 MOS model was created from the MOS3 model. HSPICE-like "XW",
  "XL","WD" and "DELVTO" model parameters were added to the MOS9 model,
  and the HSPICE temperature correction of the intrinsic silicon carrier
  concentration used in the VTO, PHI and GAMMA calculations was added.

  A level 2 BJT model was added. This new model includes DC current in
  the substrate diode, and also accepts the HSPICE-like "SUBS" parameter,
  which defines whether the model represents a "Vertical" or "Lateral"
  device, i.e. whether the substrate diode is connected to the Collector
  or the Base node. (Note that I want to re-check this, after I realised
  my understanding of the matrix was flawed. It seemed to work, though :-)


Input Read-in and Checking -

  Numbers beginning with a + sign got the input routine confused.
  Fixed now.

  Attempts to nodeset (or .IC) non-existant nodes are flagged with a
  warning.

  PWL statements on Voltage or Current sources are now checked for
  "non-increasing" time-points at the start of the simulation.
  Previously each time-point was checked as it was reached during
  the simulation, which could be very annoying if you made a mistake
  which caused the simulation to fail after hours of run-time.
  
  A check which was performed at the end of each sub-circuit expansion
  was moved to the top level. This check makes sure that all sub-circuits
  have been defined, but in its original position, it meant that if a
  sub-circuit included ANY .MODEL statements at all, then ALL the models
  called in that sub-circuit must also be defined within that
  sub-circuit. Now SPICE behaves as expected, i.e. a subcircuit may
  define its own models, but may also use models defined at any level
  above.


Miscellaneous Fixes/Enhancements -

  MOS devices reported only half of the Meyer capacitances, and did not
  include overlap capacitances, when reporting to the .OP printout, or
  when storing device capacitances to the "rawfile".

  The ideal switch devices had no time-step control to stop their
  controlling voltages/currents overshooting the switching thresholds.
  The time-step control has been modified to use the last two time
  points to estimate if the next one will move the controlling
  voltage/current past a switching threshold. If this looks likely,
  then the time-step is reduced.

  The "rawfile" writing routines have been modified to print the
  "reference value" to the console during the simulation. This lets
  the user see exactly how far and how fast the simulation is
  proceeding. The program also responds to the ESC key and exits
  gracefully, allowing the simulation to be aborted if it looks
  like it's taking too long. (Note that the ESC key only works in
  Windows, 'cos I don't know how to do it in Unix).

  .OP printout tidied up a lot to make the printout clearer.

  Analysis order changed to fix a "feature" where, if you ask for
  a .OP and a .TRAN in the same simulation, the node voltages
  printed out correspond to the .OP, but the device data was from
  the last timepoint of the .TRAN


Etc. -

  There are other minor bug fixes, and changes to reduce compiler
  warnings. There are probably some more significant fixes which
  I've forgotten :-)



I currently compile the code using Watcom C/C++ under Windows, but
I have a reasonably recent version under HPUX, although my Linux
one is a bit out of date.

I've just changed jobs, so Spice development is not my main priority
for the next few months, but I was at the stage of investigating
the BJT model, as I suspect there are some bugs in it causing
convergance problems. Also, I don't know if you've noticed the
SuperLU matrix library. It looks as tough it might be a good
replacement for the matrix code in Spice 3f4

Is this of any use to you ?

> -----Original Message-----
> From: Manu Rouat [mailto:emmanuel.rouat@wanadoo.fr]
> Sent: 23 August 2000 03:44
> To: ng-spice-devel@ieee.ing.uniroma1.it
> Subject: Re: [ng-spice-devel] Joining
> 
> 
> Robin Allen wrote:
> > 
> > Joining 123...
> 
> ...456...
> 
> manu
> 

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